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    Advantages of Tester-Per-DUT for Parallel SSD Testing

      Tien Pham
     Sep 13, 2013
    Description:

    "Advantages of Tester-Per-DUT for Parallel SSD Testing - SSD Volume Production Tester Considerations. As SSD Volume Production Increases, combined with decrease in SSD price per GB: •Pressure to reduce COT (Cost Of Test) •Factors contributing to reduce COT and lower COO (Cost of Ownership): – Higher Parallelism of Test System – Higher Flexibility and Scalability of Test System – Higher Longevity of Test System – Higher Test Coverage Capability of Test System – Shorter Production Test Time. Different Production Tester Architectures - Shared-Resource Architecture: •Multiple Devices sharing same tester resources (signals and powers) to test multiple devices (DUT) in parallel. Tester-Per-DUT Architecture: •Dedicated tester resources for each DUT when testing multiple devices (DUT) in parallel. Shared-Resource vs Tester-Per-DUT Test Time comparison for Traditional ATE Flash Tester. Would we observe a similar test time advantage if we can use a Tester-Per-DUT Test System for SSD Volume Production? Traditional PC Based SSD Tester Concept. Performance drops due to HBA Sharing=> Increase Test Time Overhead. Performance drops due to increase PCIe SSD loading on PC Motherboard. IOps Performance degradation observed when adding additional PCIe SSD DUTs and up to 37% drops at 4KB Block Size for 3 PCIe SSD DUTs. • CPU utilization increases with additional PCIe SSD DUTs and already max out at 3 PCIe SSD DUTs. Shared Resources Production Test Impact: Similar to HBA sharing: Performance does not scale Maximizing PC resources could lead to stability issue. Longer Test Time due to Serialization required for Resource Sharing. Any Tests, with shared DC power, where voltage or current measurement is required will need to be run serially (eg.ICC Tests)Any Tests where CPU Loading or Bandwidth Sharing will affect the accuracy of the test results will need to be run serially (eg.Speed Tests). Shared Resources Production Test Impact: Serialization will result in longer test time. Parallel testing on these tests will result in yield loss. Omitting these tests to reduce production test time results in sacrificing of test coverage. Longer Test Time due to Synchronization required for Resource Sharing. Any Tests, with shared DC power, where change in voltage is required will need to be synchronized for all the shared DUTs: •Vcc Margining •Write Shutoff •Power cycling. Shared Resources Production Test Impact: Synchronization of tests will result in longer test time.

    Important Tags: Advantages of Tester-Per-DUT for Parallel SSD Testing, Test Architecture for Next-Generation
    Views: 2842
    Domain: Electronics
    Category: Semiconductors


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