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    Automating Semiconductor Test Productivity

      Ron Leckie
     Jan 1, 2016
    Description:

    What did the Fabs Do? Automation in transition to 300mm wafers- Automated Material Handling Systems, Positive ID & Iot management software, Automated recipe download. Test TechXPOT Panel: "Automating Semiconductor Test Productivity" - Dale Ohmart, Michael Goldbach, David Park, Ken Harris, Texas Instruments, Xcerra, Optimal+, PDF Solutions.

    Important Tags: DFT Methodologies, Semiconductor Devices, Semiconductor Device Makers, Semiconductor Manufacturing, Information Technology
    Views: 1630
    Domain: Electronics
    Category: Semiconductors


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