Big Data and IoT technologies are transforming the way semiconductor wafer fabs are run, allowing engineers to access the dark yield of a production line for the first time. Dark yield losses are the upper areas of the yield curve, where there's historically been too much noise to identify sources of the losses and fix them. Big Data is doing this, improving yield ramps, making learning curves steeper, by making sense of the megabytes of data coming of IoT sensors in today’s wafer fab equipment. In this video we have a conversation about how this is taking place with Anantha Sethuraman, President and CEO of DFMSim. We talk about process analytics versus diagnostics, virtual metrology where the data analytics catches yield losses before they unfold and do real damage, how big data helps a fab manager prioritize which problems to work on, and more.
weVISION is a series of video interviews of visionaries by G Dan Hutcheson, his career spans more than thirty years, in which he became a well-known as a visionary for helping companies make businesses out of technology. This includes hundreds of successful programs involving product development, positioning, and launch in Semiconductor, Technology, Medicine, Energy, Business, High Tech, Environment, Electronics, healthcare and Business divisions.
big data, virtual metrology, DFMSim, IoT technologies