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    CAST ATE Interface Working Group

      Keith Thomas, Steve McDowall
     Dec 16, 2015
    Description:

    Problem Statement: There is an ever increasing use of real-time data analysis in ATE operations; Real-time ATE input and control is being required to improve test yield, throughput, efficiency, and product quality; Global test equipment and rest operations utilize a diverse range of data formats, specifications, and interface requirements; This creates significant service and application engineering costs for ATE vendors, OSAT companies, IDM test operations, software providers, and handle equipment.

    Important Tags: Cell Data, Test Cell Standards, TEMS State Diagram, TEMS Message Types, Test Cell Innovation, ATE Vendors
    Views: 1370
    Domain: Electronics
    Category: Semiconductors


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