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    Exploitation of RBER Diversity Across Dies to Improve ECC Performance In NAND Flash Drive

      Ravi Motwani
     Jun 21, 2014
    Description:

    This presentation is about the Exploitation of RBER Diversity Across Dies to Improve ECC Performance In NAND Flash Drive. RBER Variation across dies Flash Memory Summit 2012 Santa Clara, CA There is a wide variation in the die to die raw bit error rate (RBER) There is a block to block and page to page variation in the RBER, ECC designed for the worst page RBER it is an overkill, ECC designed for the average RBER is also an overkill. Modeling Can exploit Page-to-Page and Block-to-Block variation Choice of dies to spread the LDPC codeword across, Dynamic allocation as we cycle the NAND System rebuild option Effective RBER distribution is the convolution of two lognormal distributions. Read completion once host access is placed, Sequential access versus random access Payload is a mix of sequential and random access- Model Read time increase is limited and does not impair the QoS, Not all RBER gains can be realized- QoS dictates. Spread the LDPC codeword, Choice of dies to spread the LDPC codeword across.

    Important Tags: NAND Flash Drive, RBER Diversity, Improve ECC Performance, Electronics Presentation Publish Free
    Views: 3670
    Domain: Electronics
    Category: Semiconductors


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