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    Meeting Integrated Power Device Testing Challenges with the T2000

      Toni Dirscherl
     Dec 21, 2011
    Description:

    Meeting Integrated Power Device Testing Challenges with the T2000 - Integrated Power Solution (IPS) Conventional System Architecture Modules have dedicated functions, Limited parallel measurements Complex load board circuitry & muxing, Limited time to market due to complexity. New T2000 IPS Multifunctional Architecture, Multiple functions per channel, Matrix functionality built-in high current modules, Less LB circuitry design, correlation, checkers, 2-4x parallelism of competitor.

    Important Tags: Integrated, Power, Device, Testing, Challenges, with the T2000, Power Testing
    Views: 2973
    Domain: Electronics
    Category: Semiconductors


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