test ereader
    Go to Page # Page of 54
    loading

    Reliability and Yield Issues in Nano-Scale Technologies

      Prof Gilson Wirth, UFRGS
     2nd-Jun-2010
    Description: Paper covers: MOS Devices and Circuits. Sources & Types of Variations. scaling. Line Edge Roughness (LER). Discrete doping. Discrete oxide thickness. R and V body distributions. Self-heating. Hot spots. IR drops. Layout Dependent Systematic Variations. Design rules effect on Performance. Reliability & Yield. RDF: Random Dopant Fluctuations. HCI: Hot Carrier Stress. Electromigration. Transient Faults. RTS and Digital Circuits
    Important Tags: tag test erer
    Views: 2617
    Domain: Electronics
    Category: Semiconductors
    Contents:
    Reliability and Yield of MOS Devices and Circuits
    Prof Gilson Wirth UFRGS - Porto Alegre, Brazil

    This set of slides is a summary of the lecture. The lecture may be tailored to the needs and interest of the audience, and composed by a larger set of slides. The lecture covers new phenomena which play a role on the performance and reliability of highly scaled MOS devices. Performance and reliabi ... See more