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    SRC GRC University Research Highlights November 2009

      William Joyner, Kwok Ng, David Yeh, Scott List
     3rd-Mar-2010
    Views: 2120
    Domain: Electronics
    Category: Semiconductors
    Contents:
    Research Highlights for the Month of November 2009

    Computer Aided Design & Test Sciences
    Technical Thrust: Test and Testability
    Research Highlight: Analysis of the Impact of Linewidth Variation on Low-K Dielectric Breakdown Low-k time-dependent dielectric breakdown (TDDB) has been found to vary as a function of metal linewidth, when the distance between the lines is constant. Comb test structures ... See more