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Teradyne’s new UltraFLEXplus for Advanced SOC Test Solutions
Risto Puhakka
2nd-Oct-2019
Description:
Teradyne’s new UltraFLEXplus is changing the advanced SOC test with its IP, capabilities, and technologies.
Views:
4234
Domain:
Electronics
Category:
Semiconductors
Contents:
The Chip Insider®
September 26, 2019
Equipment & Emerging Markets
Teradyne’s new UltraFLEXplus for Advanced Digital
Test Solutions
• Leading-edge devices challenge test
• New devices bring increasing data volumes
• Overwhelming current testers
• Test for modern “Big D” devices
• PACE™ Multicontroller Network
• Backwards code compatibilit
...
See more
• New digital test requirements
• VLSI’s View
WildPhotons: You can not depend on your eyes…
VLSIresearch … intelligence to make better decisions faster
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
Leading-Edge Devices
End applications and designs are increasing
• New devices bring increasing data
volumes
– Driven by Moore’s Law
• Complexity of designs are
increasing
– Number of transistors are increasing
• Resulting in rapidly growing test
data
• Rapidly growing number of designs
requires effective time-to-market
solutions for test
VLSIresearch … intelligence to make better decisions faster
September 2019
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
New Devices’ Data Volumes Overwhelm Testers
Increasing transistor count:
•
•
•
More test patterns are required to
validate the functionality of the
device
more device repair is required
The numbers of tests that run overall
continues to multiply
Increasing Yield Data Out:
•
•
•
•
•
Feedback to design process
Feedback to fab processes
Failure info
Increased diagnostics
Test data
5-10 X More data in
• More Test Patterns
• More Memory Test & Repair
• More Power Supply
Adjustments
• 10,000s of test steps
Real-time adjustments
to test flow and pattern
data
•
•
•
•
Measured Results
Device Diagnostic data
Yield data
Scan Fail data
8X More data out
VLSIresearch … intelligence to make better decisions faster
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
Test for Modern Digital Devices
UltraFLEXplus for Advanced Testing
• PACETM Multicontroller Network:
–
–
–
–
P → Parallel
A → Advanced
C → Command
E → Execution
• Pipelined architecture
• Same IG-XL used on both platforms
VLSIresearch … intelligence to make better decisions faster
September 2019
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
New Devices Drive Digital Test Requirements
Capacity to handle high and
increasing data volumes
Emerging Test
Challenge:
Faster time to market
requirements
• 10x Increase in test data volume
• Shorter development cycles and
more complex test programs
Manufacturing
Impact:
• More and larger digital patterns
• More data results archived for
yield and quality improvement
• More test code to develop and
maintain
• Higher risk of test escapes or yield
loss due to coding errors
UltraFLEXplus
Technologies:
PACETM Multi-Controller tester
architecture
VLSIresearch … intelligence to make better decisions faster
•
•
Proven IG-XL software
Code compatibility to existing
UltraFLEX
September 2019
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
VLSI’s Take on Teradyne’s New UltraFLEXplus
• UltraFLEXplus plays into classic Teradyne
strengths
• New Advanced devices bring new
generation of test challenges
– 5G, AI, Autonomous driving, Edge Computing are
key drivers of this new complexity
– Complex designs with increasing transistor counts
– Increasing test and manufacturing data volumes
– Increasing design counts bring challenges of
faster time-to-market requirements
– High-performance, high-volume automated
test
– Strong software-based test solution for
manufacturing and design problem
• Teradyne is changing advanced digital
test with its IP, capabilities, and
technologies
– New and advanced devices bring rapidly
increasing test data volumes
– Trusted UltraFLEX platform with PACE™
Technology
– IG-XL test program as the core of the
solution
• Teradyne’s UltraFLEXplus delivers new
solutions for advanced testing with ability
to address increasing data volumes and
faster time-to-market requirements
VLSIresearch … intelligence to make better decisions faster
September 2019
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
VLSIresearch … intelligence to make better decisions faster
September 2019
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
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September 2019
Copyright © 2019 VLSI Research Inc. All rights reserved. Distribution rights contained in T&Cs.
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